| Bi2Ti2O7薄膜的自组装法制备及表征 |
| Preparation and Characterization of Bi2Ti2O7 Thin Films from Self-Assembled Monolayer Technique |
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| 摘要: 以Bi(NO3)3·5H2O和Ti(OC4H9)4为原料,采用自组装单层膜技术,在负载有功能化三氯十八烷基硅烷(octadecyl-trichloro-silane,OTS)的FTO基板上制备了Bi2Ti2O7 薄膜。基板表面的亲水性测试表明,紫外照射使OTS自组装单层膜表面由疏水转变为亲水,实现功能化。借助X射线衍射(XRD)、X射线能量色散谱(EDS)、扫描电子显微镜(SEM)和原子力显微镜(AFM)分析分别对Bi2Ti2O7薄膜的组成、结构和微观形貌进行了表征。结果表明,沉积溶液浓度为0.02 mol·L-1时,所得Bi2Ti2O7薄膜均匀致密。560 ℃热处理1 h、厚度为0.4 μm的Bi2Ti2O7薄膜在100 kHz的介电常数为153,介电损耗为0.089。 |
| 关键词: Bi2Ti2O7 薄膜 自组装单层膜 介电性能 |
| 基金项目: 国家青年科学基金(No.51002092);陕西省自然科学基金(No.2010JM6013)资助项目。 |
| Abstract: Bi2Ti2O7 thin films were prepared on the functionalized octadecyl-trichloro-silane (OTS)-covered fluorine-doped SnO2 (FTO) substrates by self-assembled monolayer (SAM) technique using Bi(NO3)3·5H2O and Ti(OC4H9)4 as raw materials. The test of the hydrophilicity of the substrate surface indicates that UV irradiation turns the surface of OTS-SAM film from hydrophobicity to hydrophilicity and realizes the functionalization. The composition, microstructure and microtopography of Bi2Ti2O7 thin films were characterized by X-ray Diffraction (XRD), Energy Dispersive X-ray Spectrometry (EDS), Scanning Electron Microscopy (SEM) and Atomic Force Microscope (AFM). The results indicate that the as-prepared Bi2Ti2O7 thin films are homogeneous and dense when the concentration of the deposited solution is 0.02 mol·L-1. The dielectric constant is 153 at 100 kHz and the dielectric loss is 0.089 for a 0.4 μm-thick film annealed at 560 ℃ for 1 h. |
| Keywords: Bi2Ti2O7 thin film self-assembled monolayer film dielectric properties |
| 投稿时间：2012-11-24 修订日期：2013-03-21 |
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| 夏傲,黄剑锋,谈国强,尹君.Bi2Ti2O7薄膜的自组装法制备及表征[J].无机化学学报,2013,29(7):1545-1550. |
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